Glasses for high-resistivity thick-film resistors

Citation
R. Weissmann et W. Chong, Glasses for high-resistivity thick-film resistors, ADV ENG MAT, 2(6), 2000, pp. 359-362
Citations number
6
Categorie Soggetti
Material Science & Engineering
Journal title
ADVANCED ENGINEERING MATERIALS
ISSN journal
14381656 → ACNP
Volume
2
Issue
6
Year of publication
2000
Pages
359 - 362
Database
ISI
SICI code
1438-1656(200006)2:6<359:GFHTR>2.0.ZU;2-D
Abstract
Knowledge about the role of the glass matrix in thick-film resistors is nec essary for improvement of their electrical properties for use in high-perfo rmance components. The influence of glass composition on the microstructure of ruthenate conductor and resistor parameters has been studied. Additions of TiO2, GeO2, and TeO2, which in dilute concentrations markedly increase the resistivity, improve the temperature coefficient cf the resistance and the voltage stability. The oxide enrichment of the glass film between the c onducting particles reduces the ruthenium-ion solubility and decreases the tunneling conductivity between the conductor grains.