Diffusion of indium markers at T=900 degrees C have been measured in u
ndoped and Te-doped GaAs epilayers grown by organometallic vapor phase
epitaxy. The diffusivity was found to be a linear function of electro
n concentration over the range n=2x10(17)-1.5x10(19) cm(-3). The resul
ts are consistent with the interdiffusion of AlAs-GaAs superlattices,
and the diffusivities of In and Al in GaAs at 900 degrees C are found
to be essentially identical within experimental noise. The results str
ongly suggest that group III interdiffusion in GaAs is controlled by a
Ga vacancy with a charge of -1. (C) 1997 American Institute of Physic
s.