S. Okuda et al., High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials, APPL OPTICS, 39(28), 2000, pp. 5179-5186
Interferograms obtained with ordinary interferometers, such as the Fizeau i
nterferometer or the Twyman-Green interferometer, show the contour maps of
a wave front under test. On the other hand, lateral shearing interferograms
show the difference between a wave front under test and a sheared wave fro
nt, that is, the inclination of the wave front. Therefore the shape of the
wave front under test is reconstructed by means of analyzing the difference
. To reconstruct the wave front, many methods have been proposed. An integr
ation method is usually used to reconstruct the wave front under test rapid
ly. However, this method has two disadvantages: The analysis accuracy of th
e method is low, and part of the wave front cannot be measured. To overcome
these two problems, a new, to our knowledge, integration method, improved
by use of polynomials, is proposed. The validity of the proposed method is
evaluated by computer simulations. In the simulations the analysis accuracy
achieved by the proposed method is compared with the analysis accuracy of
the ordinary integration method and that of the method proposed by Rimmer a
nd Wyant. The results of the simulations show that the analysis accuracy of
the newly proposed method is better than that of the integration method an
d that of the Rimmer-Wyant method. (C) 2000 Optical Society of America. OCI
S code: 120.3180.