Quantum point contacts fabricated by nanoimprint lithography

Citation
I. Martini et al., Quantum point contacts fabricated by nanoimprint lithography, APPL PHYS L, 77(14), 2000, pp. 2237-2239
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
14
Year of publication
2000
Pages
2237 - 2239
Database
ISI
SICI code
0003-6951(20001002)77:14<2237:QPCFBN>2.0.ZU;2-W
Abstract
The potential of integrating nanoimprint lithography into electronic device fabrication is demonstrated by means of a quantum point contact (QPC). A S i-mold with a split-gate pattern is embossed into a thin polymer film locat ed on top of a modulation-doped GaAs/AlGaAs heterostructure. The split-gate s are fabricated by metal evaporation and lift-off. The gate tip separation ranges from 180 nm to 400 nm. Transport studies performed at a temperature of 4.2 K show conductance quantization with varying gate voltages. (C) 200 0 American Institute of Physics. [S0003-6951(00)04940-8].