Mp. De Jong et al., Stability of the interface between indium-tin-oxide and poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) in polymer light-emitting diodes, APPL PHYS L, 77(14), 2000, pp. 2255-2257
A cause for degradation of polymer light-emitting diodes is the oxidation o
f the polymer by oxygen diffusing out of the indium-tin-oxide (ITO) anode.
This problem can be solved by the introduction of an organic hole-injecting
film, poly-(3,4-ethylenedioxythiophene) (PEDOT) doped with poly(styrenesul
fonate) (PSS), between the ITO and the emissive polymer. Indeed, a dramatic
improvement of the lifetime and also the luminous efficiency has been obse
rved. However, our Rutherford backscattering (RBS) studies show that the IT
O/PEDOT:PSS interface is not stable. In as prepared glass/ITO/PEDOT:PSS sam
ples 0.02 at. % indium was found in the PEDOT:PSS film. Annealing in a nitr
ogen atmosphere at 100 degrees C during 2500 h increased the indium concent
ration to 0.2 at. %. Upon exposure to air much faster degradation of the IT
O/PEDOT:PSS interface was observed; after several days in air the amount of
indium reached a saturation concentration of 1.2 at. %. The degradation of
the interface can be explained by etching of the ITO due to the strong aci
dic nature of PEDOT:PSS. (C) 2000 American Institute of Physics. [S0003-695
1(00)05040-3].