DIRECT-BAND-GAP STRUCTURES ON NANOMETER-SCALE, MICROMACHINED SILICON TIPS

Citation
Jr. Shealy et al., DIRECT-BAND-GAP STRUCTURES ON NANOMETER-SCALE, MICROMACHINED SILICON TIPS, Applied physics letters, 70(25), 1997, pp. 3458-3460
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
70
Issue
25
Year of publication
1997
Pages
3458 - 3460
Database
ISI
SICI code
0003-6951(1997)70:25<3458:DSONMS>2.0.ZU;2-R
Abstract
The selective deposition of compound semiconductors on single crystal silicon tip arrays produces optical quality, direct band gap materials on the silicon nanostructures. We demonstrate using the organometalli c vapor phase epitaxy of GaInP that the direct band gap semiconductor nucleates selectively on the silicon tips. The structural properties o f the tips (whose radius of curvature is approximately 10-20 nm) are u naltered by this chemical vapor deposition process. Furthermore, inten se band edge emission from the GaInP is observed with an external elec tron beam or laser stimulation indicating a good crystal quality for t he three dimensional epitaxial structures. (C) 1997 American Institute of Physics.