IDENTIFICATION OF THIN-FILMS ON ZINC SUBSTRATES BY FTIR AND RAMAN SPECTROSCOPIES

Citation
J. Kasperek et M. Lenglet, IDENTIFICATION OF THIN-FILMS ON ZINC SUBSTRATES BY FTIR AND RAMAN SPECTROSCOPIES, Revue de métallurgie, 94(5), 1997, pp. 713-719
Citations number
25
Categorie Soggetti
Metallurgy & Metallurigical Engineering
Journal title
Revue de métallurgie
ISSN journal
00351563 → ACNP
Volume
94
Issue
5
Year of publication
1997
Pages
713 - 719
Database
ISI
SICI code
Abstract
Raman and FTIR reflectance spectroscopies have been used for the chara cterization of the following zinc corrosion products formed by atmosph eric corrosion : (epsilon-Zn(OH)(2), hydrozincite Zn-5(CO3)(2)(OH)(6), simonkolleite Zn5Cl2(OH)(8),H2O and zinc sulfates ZnSO4,H2O, Zn4SO4(O H)(6),5H(2)O and Zn4SO4(OH)(6),H2O. The samples to analyze are either developed on metal or obtained by incrustation of submicronic particle s of the compound on the surface on zinc substrates. Both the IR refle ctance and Raman spectroscopies allow an easy identification of basic zinc salts : chloride by the Zn-O-H bending modes, carbonate and sulfa tes by the internal mode of the corresponding anion (nu(3) region), A multianalytical approach combining FTIR reflectance spectroscopy, graz ing incidence X-ray diffraction and SEM/EDS leads to different applica tions.