Fp. Korshunov et Sb. Lastovsky, Effect of radiation defects on avalanche breakdown volrage at silicon p-n-junctions, DAN BELARUS, 43(4), 1999, pp. 44-47
Irradiation of Silicon p-n-junctions by electrons with energy 4 MeV increas
es the avalanche breakdown voltage at room temperature which is caused by d
ecrease of concentration gradient of minor impurities as the result of radi
ation defects containing basic doping agents.