A defect structure has been observed for certain ferroelectric liquid cryst
al mixtures in the surface stabilised device geometry when cooled towards a
mbient temperature. X-ray and electro-optic studies suggest that the sample
, initially in the chevron layer structure, forms a uniformly tilted layer
structure spontaneously. This seriously degrades device contrast and switch
ing properties. The effect of both liquid crystal composition and alignment
layer pretilt are reported and recommendations made to ensure that the def
ect does not occur, thereby allowing good device performance to be maintain
ed.