Two-dimensional quantum mechanical simulation of charge distribution in silicon MOSFETs

Citation
A. Abramo et al., Two-dimensional quantum mechanical simulation of charge distribution in silicon MOSFETs, IEEE DEVICE, 47(10), 2000, pp. 1858-1863
Citations number
22
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
47
Issue
10
Year of publication
2000
Pages
1858 - 1863
Database
ISI
SICI code
0018-9383(200010)47:10<1858:TQMSOC>2.0.ZU;2-L
Abstract
A solver for the two-dimensional (2-D) Schrodinger equation based on the k- space representation of the solution has been developed and applied to the simulation of 2-D electrostatic quantum effects in nano-scale MOS transisto rs, This paper presents the mathematical framework of the simulator, addres ses the related accuracy and efficiency problems, and discusses the simulat ions performed to validate it. Furthermore, the 2-D quantum effects observe d in the simulation of charge densities in tens-hundreds nanometer scale MO S structures are described.