Visualizing the interrelation between surface topograph and surface potential by means of a scanning Maxwell stress microscope

Authors
Ozeki, K Itoh, J Yamamoto, S
Citation
K. Ozeki et al., Visualizing the interrelation between surface topograph and surface potential by means of a scanning Maxwell stress microscope, JPN J A P 1, 39(9A), 2000, pp. 5261-5262
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
39
Issue
9A
Year of publication
2000
Pages
5261 - 5262
Database
ISI
SICI code
Abstract
An scanning Maxwell stress microscope (SMM) is utilized to visualize, on a microscale, the intercorrelation between the surface topograph and correspo nding surface potential. It is found that the surface potential of the Fe-4 2Ni sample surface is weakly negatively correlated with the topographic hei ght, while there is no correlation in the case of the Au surface used as a reference.