A 25-nm-long channel metal-gate p-type Schottky source/drain metal-oxide-semiconductor field effect transistor on separation-by-implanted-oxygen substrate

Citation
A. Itoh et al., A 25-nm-long channel metal-gate p-type Schottky source/drain metal-oxide-semiconductor field effect transistor on separation-by-implanted-oxygen substrate, JPN J A P 1, 39(8), 2000, pp. 4757-4758
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
8
Year of publication
2000
Pages
4757 - 4758
Database
ISI
SICI code
Abstract
A 25-nm-long channel metal-gate PtSi Schottky source/drain metal-oxide-semi conductor field effect transistor (MOSFET) fabricated on a separation-by-im planted-oxygen (SIMOX) substrate was demonstrated. The drain current and tr ansconductance were 293 mu A/mu m and 431 mS/mm, respectively.