Relation between the radius of tip curvature and the light emission efficiency from scanning tunneling microscope

Authors
Iwami, M Uehara, Y Ushioda, S
Citation
M. Iwami et al., Relation between the radius of tip curvature and the light emission efficiency from scanning tunneling microscope, JPN J A P 1, 39(8), 2000, pp. 4912-4913
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
39
Issue
8
Year of publication
2000
Pages
4912 - 4913
Database
ISI
SICI code
Abstract
The relation between the efficiency of scanning tunneling microscope light emission (STM-LE) and the radius of tip curvature has been studied using si lver tips. The emission efficiency increases with decreasing radius of tip curvature p for p > 80 nm. This result agrees qualitatively with the predic tion of a theory that includes the effect of electromagnetic retardation.