CALCULATION OF LATERAL FORCE COMPONENTS IN AFM CONTACT MODE IN APPLICATION TO THE DIAGNOSTIC OF POINT-DEFECTS

Authors
BLAGOV EV KLIMCHITSKAYA GL MOSTEPANENKO VM
Citation
Ev. Blagov et al., CALCULATION OF LATERAL FORCE COMPONENTS IN AFM CONTACT MODE IN APPLICATION TO THE DIAGNOSTIC OF POINT-DEFECTS, Surface review and letters, 4(2), 1997, pp. 271-278
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
Surface review and letters → ACNP
ISSN journal
0218625X
Volume
4
Issue
2
Year of publication
1997
Pages
271 - 278
Database
ISI
SICI code
0218-625X(1997)4:2<271:COLFCI>2.0.ZU;2-G
Abstract
Lateral force components are calculated when scanning the AFM tip abov e the surface of close-packed structure in contact mode. Both the case of the perfect surface and of the surface with point defects of diffe rent types are considered. It is shown that the lateral force profiles give the essential information which enables one not only to determin e the point defect position but also to ascertain the type of defect.