Structural and magnetic studies of sputtered Fe1-xCrx thin films

Citation
Nh. Duc et al., Structural and magnetic studies of sputtered Fe1-xCrx thin films, J APPL PHYS, 88(8), 2000, pp. 4778-4782
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
8
Year of publication
2000
Pages
4778 - 4782
Database
ISI
SICI code
0021-8979(20001015)88:8<4778:SAMSOS>2.0.ZU;2-1
Abstract
X-ray diffraction, magnetization, and Mossbauer effect investigations have been performed for sputtered Fe1-xCrx (0 less than or equal to x less than or equal to 0.54) thin films. The body-centered-cubic (bcc) phase appears f or x < 0.32, while the sigma phase is formed for 0.38 less than or equal to x less than or equal to 0.44. For 0.32 less than or equal to x < 0.38 and 0.44 < x less than or equal to 0.54, the samples are composed of both bcc a nd sigma phases. As the Cr concentration increases, the ferromagnetic fract ion, magnetization, and magnitude of the hyperfine field decrease, whereas the magnitude of the isomer shift increases. The Fe and Cr magnetic moments , isomer shift, and hyperfine field of the bcc Fe-Cr phase have been deduce d and are discussed consistently in terms of charge and spin distributions, as well as magnetic valence. (C) 2000 American Institute of Physics. [S002 1-8979(00)08419-X].