Theory of electromagnetic field imaging and spectroscopy in scanning near-field optical microscopy

Citation
Ja. Porto et al., Theory of electromagnetic field imaging and spectroscopy in scanning near-field optical microscopy, J APPL PHYS, 88(8), 2000, pp. 4845-4850
Citations number
50
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
8
Year of publication
2000
Pages
4845 - 4850
Database
ISI
SICI code
0021-8979(20001015)88:8<4845:TOEFIA>2.0.ZU;2-2
Abstract
We derive a general expression for the signal in scanning near-field optica l microscopy. This expression, based on the reciprocity theorem of electrom agnetism, is an overlapping integral between the local electric field and a function that characterizes the tip. In particular, it includes the depend ence on wavelength, illumination conditions, and polarization. To illustrat e the potentiality of this theory, we discuss the polarization behavior and the spectral response of the apertureless setup. (C) 2000 American Institu te of Physics. [S0021-8979(00)02821-8].