Secondary emission of dielectrics used in plasma display panels

Citation
G. Auday et al., Secondary emission of dielectrics used in plasma display panels, J APPL PHYS, 88(8), 2000, pp. 4871-4874
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
8
Year of publication
2000
Pages
4871 - 4874
Database
ISI
SICI code
0021-8979(20001015)88:8<4871:SEODUI>2.0.ZU;2-P
Abstract
This experimental study concerns the secondary emission coefficient gamma f or two dielectrics (MgO and enamel) used in plasma display panels. Differen t pure rare gases were considered at pressures varying from 5 to 50 Torr. H ere, we present the variations of coefficient gamma as a function of the re duced field E/p. They were obtained by introducing the breakdown voltages m easured experimentally on a sample of plasma panel, into the self-sustained equation. Concerning a 0.5 mu m thick MgO layer, results are shown for fiv e gases (helium, neon, argon, krypton, and xenon) whereas for a 25 mu m thi ck enamel layer, they are presented for neon and xenon. (C) 2000 American I nstitute of Physics. [S0021- 8979(00)01220-2].