Effect of support compliance and residual stress on the shape of doubly supported surface-micromachined beams

Citation
Mj. Kobrinsky et al., Effect of support compliance and residual stress on the shape of doubly supported surface-micromachined beams, J MICROEL S, 9(3), 2000, pp. 361-369
Citations number
21
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
ISSN journal
10577157 → ACNP
Volume
9
Issue
3
Year of publication
2000
Pages
361 - 369
Database
ISI
SICI code
1057-7157(200009)9:3<361:EOSCAR>2.0.ZU;2-C
Abstract
Doubly supported silicon-micromachined beams are increasingly used to study the mechanical properties of materials. Residual stresses in the beams and support compliance cause significant vertical deflections, which affect th e performance of these micromachined devices. We present here both experime ntal results for doubly supported polysilicon surface-micromachined beams, and an elastic model of the devices that takes into account the compliance of the supports and the geometrical nonlinear dependence of the vertical de flections on the stress in the beam. An elastic one-dimensional model was u sed for the beams, and the response of the supports to forces and moments w as obtained using finite-element method simulations. The model explains a p reviously observed gradual increase of the maximum vertical deflections of the beams with increasing length at a given constant residual stress and, i n agreement with experimental observations, predicts two stable states for compressively stressed beams: one with the beam bent up, the other down. We introduce a critical biaxial residual stress sigma(rc), above which there are significant deflections of the beams. sigma(rc) can be used in practice to determine the maximum allowable compressive biaxial residual stress as a function of the beam length. The effect of variations of the compliance o f the supports is reported.