Atomic force microscopy investigation of nanometer-scale modifications of polymer morphology caused by ultraviolet irradiation

Authors
Nowicki, M Kaczmarek, H Czajka, R Susla, B
Citation
M. Nowicki et al., Atomic force microscopy investigation of nanometer-scale modifications of polymer morphology caused by ultraviolet irradiation, J VAC SCI A, 18(5), 2000, pp. 2477-2481
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
5
Year of publication
2000
Pages
2477 - 2481
Database
ISI
SICI code
0734-2101(200009/10)18:5<2477:AFMION>2.0.ZU;2-J
Abstract
The surface morphology of polystyrene (PS), poly(ethylene oxide) (PEO), (PS ) and polystyrene/poly(methyl methacrylate) blend (PS/PMMA) before and afte r ultraviolet (UV) irradiation was studied by means of atomic force microsc opy. It was shown that the UV-induced changes were more noticeable on PS an d PS/PMMA blend than on PEO samples. Moreover, the UV irradiation of PS sam ple doped with poly(methyl methacrylate) caused distinct changes in surface morphology. The nanometer-scale structures of the rod-like shape bumps of diameter of 300 nm and the height of 75 nm were created. We also showed tha t the very small forces of 0.2 nN are high enough to modify the surface of PS sample. (C) 2000 American Vacuum Society. [S0734-2101(00)05805-X].