Spectra mapping of scanning tunneling microscope-induced light from electrochemically deposited Ag films on Au

Citation
R. Nishitani et al., Spectra mapping of scanning tunneling microscope-induced light from electrochemically deposited Ag films on Au, J VAC SCI A, 18(5), 2000, pp. 2482-2485
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
18
Issue
5
Year of publication
2000
Pages
2482 - 2485
Database
ISI
SICI code
0734-2101(200009/10)18:5<2482:SMOSTM>2.0.ZU;2-M
Abstract
We have carried out spectra mapping measurements of scanning tunneling micr oscope (STM)-induced photon emission from electrochemically deposited Ag fi lms on Au. The luminescence spectra for Ag and Au films are recorded at the same time as the STM topography image in air. The spectrally resolved phot on intensity map is obtained from the observed 4096 spectra, which shows a correlation with the topography. The luminescence spectra observed for Ag f ilms exhibit a broader band of spectra with a spectral shift toward a short er wavelength compared with Au films. The spectral modes are compared with the topography of the films. (C) 2000 American Vacuum Society. [S0734-2101( 00)05605-0].