Characterization of a subpicosecond x-ray streak camera for ultrashort laser-produced plasmas experiments

Citation
P. Gallant et al., Characterization of a subpicosecond x-ray streak camera for ultrashort laser-produced plasmas experiments, REV SCI INS, 71(10), 2000, pp. 3627-3633
Citations number
31
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
10
Year of publication
2000
Pages
3627 - 3633
Database
ISI
SICI code
0034-6748(200010)71:10<3627:COASXS>2.0.ZU;2-O
Abstract
We present results of the characterization of an ultrafast x-ray streak cam era, based on Photonis (formerly Philips Photonics) P860 tube, developed fo r use in ultrashort laser-produced plasma research. The streak camera prese nted here (called PX1) has been extensively characterized with continuous a nd pulsed x-ray sources. Time resolution of 350 fs in the keV x-ray range h as been achieved, while maintaining a high spatial resolution of 40 mu m al ong a direction perpendicular to the time dispersion axis. It is shown that the streak camera response is lower when the photocathode is illuminated b y a pulsed source than when used with a continuous one. This effect seems t o be related to a change in the phosphor response. The camera has been used to achieve high-resolution subpicosecond time-resolved spectroscopy of ult rashort laser plasmas allowing the measurements of K-shell line emission du rations of 700 fs. (C) 2000 American Institute of Physics. [S0034-6748(00)0 5410-1].