Three-configurational surface magneto-optical Kerr effect measurement system for an ultrahigh vacuum in situ study of ultrathin magnetic films

Citation
Jw. Lee et al., Three-configurational surface magneto-optical Kerr effect measurement system for an ultrahigh vacuum in situ study of ultrathin magnetic films, REV SCI INS, 71(10), 2000, pp. 3801-3805
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
10
Year of publication
2000
Pages
3801 - 3805
Database
ISI
SICI code
0034-6748(200010)71:10<3801:TSMKEM>2.0.ZU;2-H
Abstract
We have constructed a three-configurational surface magneto-optical Kerr ef fect system, which provides the simultaneous measurements of the "polar," " longitudinal," and "transverse" Kerr hysteresis loops at the position where deposition is carried out in an ultrahigh vacuum growth chamber. The prese nt system enables in situ three-dimensional vectorial studies of ultrathin film magnetism with a submonolayer sensitivity. We present three-configurat ional hysteresis loops measured during the growth of Co films on Pd(111), g lass, and Pd/glass substrates. (C) 2000 American Institute of Physics. [S00 34-6748(00)05310-7].