A short and fast iterative algorithm for calculating the geometric factor i
n a van der Pauw sheet resistance measurement is described. Fractional erro
rs below 10(-14) are obtained with less than 50 iterations for any value of
the resistance ratio R-AB,R-CD/R-BC,R-DA. (C) 2000 American Institute of P
hysics. [S0034-6748(00)03210-X].