Selective specimen preparation for TEM observation of the cross-section ofindividual carbon nanotube/metal junctions

Authors
Wei, BQ Kohler-Redlich, P Bader, U Heiland, B Spolenak, R Arzt, E Ruhle, M
Citation
Bq. Wei et al., Selective specimen preparation for TEM observation of the cross-section ofindividual carbon nanotube/metal junctions, ULTRAMICROS, 85(2), 2000, pp. 93-98
Citations number
18
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
85
Issue
2
Year of publication
2000
Pages
93 - 98
Database
ISI
SICI code
0304-3991(200010)85:2<93:SSPFTO>2.0.ZU;2-X
Abstract
We present here an efficient method to prepare a transmission electron micr oscopy (TEM) specimen for selective observation of the cross-section of ind ividual nanoscale structures. As a typical example, the cross-sectional TEM observation of a quasi-one-dimensional material - a nano-electronic compon ent based on an individual carbon nanotube - is presented. (C) 2000 Elsevie r Science B.V. All rights reserved.