Sh. Cheng et al., Effects of deposition temperature on electrical properties of hydrogenatedamorphous carbon films, ACT PHY C E, 49(10), 2000, pp. 2041-2046
Hydrogenated amorphous carbon films were deposited using ECR plasma with be
nzene as carbon source at varying substrate temperature. The effects of dep
osition temperature on the resistivity and the intensity of electric break
down have been investigated. The results show these properties depend on th
eir growth conditions. The experiment results are further investigated usin
g Raman spectra analysis.