NEW METHOD FOR THE CHARACTERIZATION OF DOMAIN MORPHOLOGY OF POLYMER BLENDS USING RUTHENIUM TETROXIDE STAINING AND LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY (LVSEM)

A new method has been developed for the analysis of domain morphology of stained polyolefin blends by low voltage scanning electron microsco py (LVSEM). The component polymers of the blend are differentiated by heavy staining with RuO4. LVSEM at low accelerating voltages provides high resolution imaging and minimal beam damage to the sample. The met hod is routinely applied to the analys sis of domain morphology in mou lded samples, fibres and films, to failure analysis and to the analysi s of layer morphology of co-extruded films. (C) 1997 Elsevier Science Ltd.