Highly sensitive beryllium detection with microwave plasma source atomic emission spectrometry

Citation
Yx. Su et al., Highly sensitive beryllium detection with microwave plasma source atomic emission spectrometry, ANALYT CHIM, 422(2), 2000, pp. 209-216
Citations number
33
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICA CHIMICA ACTA
ISSN journal
00032670 → ACNP
Volume
422
Issue
2
Year of publication
2000
Pages
209 - 216
Database
ISI
SICI code
0003-2670(20001012)422:2<209:HSBDWM>2.0.ZU;2-8
Abstract
A highly sensitive technique for beryllium determination using microwave in duced plasma atomic emission spectrometry (MIP-AES) is explored in this wor k based on a self-assembled instrumental system. The analytical performance of this system for beryllium determination was examined using argon as wor king gas and an ultrasonic nebulization-desolvation system for solution sam ple introduction. Experimental operating parameters, such as working gas ho w rate, microwave power, and observation height were optimized during the s ystem characterization. Influence of matrix elements on beryllium determina tion was studied. The matrix elements, such as Cu and Ni, were found to hav e little influence on Be(I) 265.06 nm spectral line even at a concentration of 50 mu g ml(-1), which is 1000 times higher than that of beryllium. Shor t-term stability of the MIP-AES system was evaluated and a relative standar d deviation of 1.8% is achieved. A calibration range of five orders of magn itude for beryllium determination could be obtained with its multiple spect ral lines. The detection limits of Be(II) 313.04/313.11, and Be(I) 234.86 n m were calculated based on 3 sigma using 1% HNO3 blank solution and shown t o be in parts per trillion level. Published by Elsevier Science B.V.