Scanning second-harmonic/third-harmonic generation microscopy of gallium nitride

Authors
Sun, CK Chu, SW Tai, SP Keller, S Mishra, UK DenBaars, SP
Citation
Ck. Sun et al., Scanning second-harmonic/third-harmonic generation microscopy of gallium nitride, APPL PHYS L, 77(15), 2000, pp. 2331-2333
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
15
Year of publication
2000
Pages
2331 - 2333
Database
ISI
SICI code
0003-6951(20001009)77:15<2331:SSGMOG>2.0.ZU;2-M
Abstract
Scanning second-harmonic generation and third-harmonic generation microscop y of a gallium nitride (GaN) sample was demonstrated using a femtosecond Cr :forsterite laser. Taking advantage of the electric-field enhanced second-h armonic generation effect and bandtail state resonance effect, the obtained second-harmonic and third-harmonic generation microscopic images revealed the piezoelectric field and bandtail state distributions in a GaN sample. ( C) 2000 American Institute of Physics. [S0003-6951(00)03141-7].