Neel "orange-peel" coupling in magnetic tunneling junction devices

Authors
Schrag, BD Anguelouch, A Ingvarsson, S Xiao, G Lu, Y Trouilloud, PL Gupta, A Wanner, RA Gallagher, WJ Rice, PM Parkin, SSP
Citation
Bd. Schrag et al., Neel "orange-peel" coupling in magnetic tunneling junction devices, APPL PHYS L, 77(15), 2000, pp. 2373-2375
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
15
Year of publication
2000
Pages
2373 - 2375
Database
ISI
SICI code
0003-6951(20001009)77:15<2373:N"CIMT>2.0.ZU;2-2
Abstract
We present measurements of the magnitude of Neel "orange-peel" coupling due to interface roughness in a series of magnetic tunneling junction devices. Results from magnetometry and transport measurements are shown to be in go od agreement with the theoretical model of Neel. In addition, we have used transmission electron microscopy to directly probe the sample interface rou ghness and obtain results consistent with the values obtained by magnetomet ry and transport methods. (C) 2000 American Institute of Physics. [S0003-69 51(00)00541-6].