Ultraviolet lithography of self-assembled monolayers for submicron patterned deposition

Citation
S. Friebel et al., Ultraviolet lithography of self-assembled monolayers for submicron patterned deposition, APPL PHYS L, 77(15), 2000, pp. 2406-2408
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
15
Year of publication
2000
Pages
2406 - 2408
Database
ISI
SICI code
0003-6951(20001009)77:15<2406:ULOSMF>2.0.ZU;2-N
Abstract
We report on a lithographic technique that uses self-assembled monolayers ( SAMs) as a resist to fabricate patterned, chemically functionalized surface s. Large area line, square, and triangular patterns with a periodicity of 5 32 nm were generated exposing SAMs of hydrophobic or hydrophilic alkanethio lates to an ultraviolet laser interference pattern at 193 nm for only a few minutes (corresponding to similar to 16 J/cm(2)) followed by the immersion into an alternating thiol. Patterned films of CaCO3, Zn(OH)(2), and polyme rs were directly deposited on these templates. Using substrates patterned w ith oppositely charged SAMs, large periodic arrays of charged colloids were fabricated. (C) 2000 American Institute of Physics. [S0003-6951(00)01041-X ].