A. Fissel et al., Advances in the molecular-beam epitaxial growth of artificially layered heteropolytypic structures of SiC, APPL PHYS L, 77(15), 2000, pp. 2418-2420
The controlled growth of SiC heteropolytypic structures consisting of hexag
onal and cubic polytypes has been performed by solid-source molecular-beam
epitaxy. On on-axis substrates, 4H/3C/4H-SiC(0001) and 6H/3C/6H-SiC(0001) s
tructures were obtained by first growing the 3C-SiC layer some nanometer th
ick at lower substrate temperatures (T=1550 K) and Si-rich conditions and a
subsequent growth of alpha-SiC on top of the 3C-SiC layer at higher T (160
0 K) under more C-rich conditions. On off-axis substrates, multiheterostruc
tures consisting of 4H/3C- or 6H/3C-stacking sequences were also obtained b
y first nucleating selectively one-dimensional wire-like 3C-SiC on the terr
aces of well-prepared off-axis alpha-SiC(0001) substrates at low T(< 1500 K
). Next, SiC was grown further in a step-flow growth mode at higher T and S
i-rich conditions. After the growth, many wire-like regions consisting of 3
C-SiC were found also within the hexagonal layer material matrix indicating
a simultaneous step-flow growth of both the cubic and the hexagonal SiC ma
terial. (C) 2000 American Institute of Physics. [S0003-6951(00)01039-1].