Diffracted Gaussian beam analysis of quasioptical multi-reflector systems

Citation
C. Rieckmann et al., Diffracted Gaussian beam analysis of quasioptical multi-reflector systems, ELECTR LETT, 36(19), 2000, pp. 1600-1601
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
36
Issue
19
Year of publication
2000
Pages
1600 - 1601
Database
ISI
SICI code
0013-5194(20000914)36:19<1600:DGBAOQ>2.0.ZU;2-4
Abstract
A novel approach for analysing quasi-optical multi-reflector systems is des cribed. The proposed analysis method expands an input he;un into a set of e lementary Gaussian beams that are propagated in a geometrical optics manner . The canonical problem of a 3D Gaussian beam incident upon a Kirchhoff hal f-screen complements the reflected beam by a Gaussian beam diffracted field term. The total output field is again expanded into a Gaussian beam expans ion to provide a modular technique.