Surface imaging by an ion probe scanning

Citation
K. Wang et al., Surface imaging by an ion probe scanning, EPJ-APPL PH, 11(2), 2000, pp. 147-151
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN journal
12860042 → ACNP
Volume
11
Issue
2
Year of publication
2000
Pages
147 - 151
Database
ISI
SICI code
1286-0042(200008)11:2<147:SIBAIP>2.0.ZU;2-9
Abstract
We describe the realization of an ultrahigh vacuum scanning ion beam appara tus. The ion gun is based on the principle of field emission from a liquid gallium film wetting a sharp needle. The beam can be focused to a probe spo t with a diameter less than 40 nm. The gun is fixed to an ultrahigh vacuum chamber, and is driven by a digital scanning device that works at variable frequency. The video image is built from the outgoing electrons resulting f rom the ion beam impacts. We describe the setup and discuss the relation be tween the ion probe current and the scanning speed. Specific applications t o surface imaging are presented.