Forsterite surface composition in aqueous solutions: A combined potentiometric, electrokinetic, and spectroscopic approach

Citation
Os. Pokrovsky et J. Schott, Forsterite surface composition in aqueous solutions: A combined potentiometric, electrokinetic, and spectroscopic approach, GEOCH COS A, 64(19), 2000, pp. 3299-3312
Citations number
56
Categorie Soggetti
Earth Sciences
Journal title
GEOCHIMICA ET COSMOCHIMICA ACTA
ISSN journal
00167037 → ACNP
Volume
64
Issue
19
Year of publication
2000
Pages
3299 - 3312
Database
ISI
SICI code
0016-7037(200010)64:19<3299:FSCIAS>2.0.ZU;2-I
Abstract
Surfaces of natural and synthetic forsterite (Fo(91) and Fo(100)) in aqueou s solutions at 25 degrees C were investigated using surface titrations in b atch and limited residence time reactors, column filtration experiments, el ectrokinetic measurements (streaming potential and electrophoresis techniqu es), Diffuse Reflectance Infrared Spectroscopy (DRIFT), and X-ray Photoelec tron Spectroscopy (XPS). At pH < 9, a Mg-depleted, Si-rich layer (<20 Angst rom thick) is formed on the forsterite surface due to a Mg2+ <----> H+ exch ange reaction. Electrokinetic measurements yield a pH(IEP) value of 4.5 cor responding to the dominance of SiO2 in the surface layer at pH < 9. In cont rast, surface titrations of fresh powders give an apparent pH(PZC) of about 10 with the development of a large positive charge (up to 10(-4) mol/m(2) or 10 C/m(2)) in the acid pH region. This may be explained by penetration o f H+ into the first unit cells of forsterite surface. The surface charge of acid-reacted forsterite is one or two orders of magnitude lower than that of unreacted forsterite with an apparent pH(PZC) at around 6.5 and a pH(IEP ) value of 2.1 which is close to that for amorphous silica and reflects the formation of a silica-rich layer on the surface. XPS analyses indicate the penetration of hydrogen into the surface and the polymerization of silica tetrahedra in this leached layer. At pH > 10, a Si-deficient, Mg-rich surfa ce layer is formed as shown by XPS analyses and the preferential Si release from the surface during column filtration experiments. Copyright (C) 2000 Elsevier Science Ltd.