Removal of NF3 from semiconductor-process flue gases by tandem packed-bed plasma and adsorbent hybrid systems

Citation
Js. Chang et al., Removal of NF3 from semiconductor-process flue gases by tandem packed-bed plasma and adsorbent hybrid systems, IEEE IND AP, 36(5), 2000, pp. 1251-1259
Citations number
18
Categorie Soggetti
Engineering Management /General
Journal title
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
ISSN journal
00939994 → ACNP
Volume
36
Issue
5
Year of publication
2000
Pages
1251 - 1259
Database
ISI
SICI code
0093-9994(200009/10)36:5<1251:RONFSF>2.0.ZU;2-K
Abstract
A tandem hybrid gas cleanup system, consisting of a BaTiO3 packed-bed plasm a reactor and a CaCO3 adsorbent filter, was used to study the removal of NF 3 from semiconductor-process flue gases. Plasma-chemical kinetics of N-2-NF 3-O-2-H-2 gas mixtures suggested byproducts observed in the experiments. Th e laboratory-scale system showed NF3 removal at atmospheric pressure. Typic ally, 100% NF3 abatement was achieved with an inlet concentration of 5000 p pm and a gas residence time in the reactor less than 10 s.