Extra wideband polarimetry, interferometry and polarimetric interferometryin synthetic aperture remote sensing

The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, targe t orientation, symmetries and material constituents can be recovered with c onsiderable improvement above that of standard amplitude-only radar; with r adar interferometry the spatial tin depth) structure can be explored. In Po larimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, i t is possible to recover such co-registered textural and spatial informatio n from POL-IN-SAR digital image data sets simultaneously, including the ext raction of Digital Elevation Maps (DEM) from either Polarimetric (scatterin g matrix) or Interferometric (single platform: dual antenna) SAR Systems. S imultaneous Polarimetric-plus-Interferometric SAR offers the additional ben efit of obtaining co-registered textural-plus-spatial three-dimensional POL -IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interf erometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by eithe r designing Multiple Dual-Polarization Antenna POL IN-SAR systems or by app lying advanced POL-IN-SAR image compression techniques, it will result in P OL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imag ing. This is of direct relevance to local-to-global environmental backgroun d validation, stress assessment and stress-change monitoring of the terrest rial and planetary covers.