X-ray fluorescence spectrometry

Citation
Pj. Potts et al., X-ray fluorescence spectrometry, J ANAL ATOM, 15(10), 2000, pp. 1417-1442
Citations number
447
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN journal
02679477 → ACNP
Volume
15
Issue
10
Year of publication
2000
Pages
1417 - 1442
Database
ISI
SICI code
0267-9477(2000)15:10<1417:XFS>2.0.ZU;2-P
Abstract
This annual review of X-ray fluorescence covers developments over the perio d 1999-2000 in instrumentation and detectors, matrix correction and spectru m analysis software, X-ray optics and microfluorescence, synchrotron XRF, T XRF, portable XRF and on-line applications as assessed from the published l iterature. The review also includes a survey of applications, covering samp le preparation, geological, environmental, archaeological, forensic, biolog ical, clinical, thin films, chemical state and speciation studies. During t he current review period, further advances have taken place in the developm ent of high resolution semiconductor detectors and in the design and applic ation of XRF instrumentation for space and planetary research. Overall, the papers reviewed here again confirm the important contribution the XRF tech nique makes to a wide range of scientific endeavour.