SPECTROSCOPIC AND PHOTOREFRACTIVE CHARACTERIZATION OF CADMIUM TELLURIDE CRYSTALS CODOPED WITH VANADIUM AND MANGANESE

Electron paramagnetic resonance spectroscopy, secondary-ion mass spect rometry, and moving space charge field techniques were used to charact erize semi-insulating cadmium telluride crystals codoped with vanadium and manganese. Photorefractive two-wave-mixing gains were observed fo r CdTe:Mn,V that were a factor of similar to 2 larger than that measur ed for singly doped CdTe:V. Secondary-ion mass spectrometry and electr on paramagnetic resonance spectroscopy were used to establish the chem ical identities, concentration levels, and charge states of the dopant s that govern the photorefractive response in this semiconductor mater ial. In CdTe:V,Mn only the Mn2+ EPR was observed; this result, combine d with the photorefractive data, provides information regarding the ex istence of a manganese-related ionization level in the band gap of CdT e.