R. Shekhar et Kf. Jensen, TEMPERATURE-PROGRAMMED DESORPTION INVESTIGATIONS OF HYDROGEN AND AMMONIA REACTIONS ON GAN, Surface science, 381(1), 1997, pp. 581-588
We report data for chemisorption and reaction of deuterium and isotopi
cally labeled ammonia on single-crystalline GaN films grown on sapphir
e substrates. Temperature programmed desorption (TPD) and Auger electr
on spectroscopy (AES) studies, following exposure of the clean GaN fil
m at room temperature to the probe reactant species, were conducted un
der UHV conditions. Deuterium desorption took place over a wide temper
ature range, 525-800 K, with molecular deuterium as the only product.
At low exposures, two distinct deuterium desorption peaks at similar t
o 660 and 770 K were observed. The deuterium desorption peak at 660 K
shifted to lower temperatures with increasing D adatom coverages. TPD
experiments after ammonia adsorption on GaN revealed small amounts of
hydrogen desorbed at similar to 600 K and over a range 660-770 K, sugg
esting partial decomposition of ammonia. Molecular ammonia desorption
was observed at similar to 560 and 600 K, with the low temperature des
orption state growing with increasing ammonia exposures. Further studi
es on deuterium-precovered GaN films indicated that ammonia production
resulted from recombination of NHx species and hydrogen adatoms on th
e surface. (C) 1997 Elsevier Science B.V.