Bv. Petukhov, MODIFIED PEIERLS MECHANISM OF DISLOCATION-MOTION IN A RANDOM-FIELD OFINTERNAL MICROSTRESSES, Crystallography reports, 42(2), 1997, pp. 161-168
The effect of a real crystal structure on the mobility of dislocations
moving in a crystalline held is simulated by introducing a random fie
ld of internal stresses. The allowance for the statistical scatter in
the kinetic characteristics of elementary dislocation motion dictates
the use of the probabilistic description instead of the conventional t
heory based on the Peierls mechanism. In addition to modes observed in
an ideal crystal, new modes of dislocation motion implemented in a re
al crystal are considered and classified over wide ranges of temperatu
res and stresses. The results obtained allow a qualitative interpretat
ion of the dislocation mobility under different loads.