Isoelectric point of Si3N4 measured by an atomic force microscopy

Citation
H. Zhang et al., Isoelectric point of Si3N4 measured by an atomic force microscopy, POL J CHEM, 74(10), 2000, pp. 1499-1502
Citations number
18
Categorie Soggetti
Chemistry
Journal title
POLISH JOURNAL OF CHEMISTRY
ISSN journal
01375083 → ACNP
Volume
74
Issue
10
Year of publication
2000
Pages
1499 - 1502
Database
ISI
SICI code
0137-5083(200010)74:10<1499:IPOSMB>2.0.ZU;2-#