In commercial and research applications, thin-film systems are used to perf
orm various processes at different vacuum levels. All of these thin-film sy
stems use some type of vacuum control method to maintain the process chambe
r at a specific vacuum level during the process. Since most thin-film proce
sses change their rate and effectiveness as a function of the vacuum level,
it Is important to maintain and control those process pressures to ensure
consistent, predictable results. In semiconductor and thin-film transistor
display manufacturing tools, there are frequently multiple chambers on each
tool that perform different functions, and each chamber uses a separate pr
essure control system.