POLYANILINE TOLUENESULFONATES - X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY

Citation
M. Inoue et al., POLYANILINE TOLUENESULFONATES - X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY, Journal of macromolecular science. Pure and applied chemistry, A34(8), 1997, pp. 1493-1497
Citations number
8
Categorie Soggetti
Polymer Sciences
ISSN journal
10601325
Volume
A34
Issue
8
Year of publication
1997
Pages
1493 - 1497
Database
ISI
SICI code
1060-1325(1997)A34:8<1493:PT-XAE>2.0.ZU;2-I
Abstract
Two polyaniline toluenesulfonates with different crystallinities were synthesized by using iron(III) and copper(II) toluenesulfonates, respe ctively, as oxidative coupling agents. The toluenesulfonate obtained w ith the iron(III) salt showed well-defined X-ray powder diffraction pe aks; the other toluenesulfonate showed a diffuse pattern. When the tol uenesulfonate with the higher crystallinity was neutralized and then d oped again with HCl, the resulting polyaniline chloride showed an X-ra y pattern closely resembling that of the original toluenesulfonate. Th e diffraction patterns of the toluenesulfonate and the chloride can be interpreted by assuming an essentially identical crystal packing in t he unit cell. Since the cell volumes of the two salts are almost ident ical, the counteranion with a larger molecular size has a closer conta ct with a polyaniline chain; the close intermolecular contact may enha nce interchain diffusion of charge carriers.