M. Inoue et al., POLYANILINE TOLUENESULFONATES - X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY, Journal of macromolecular science. Pure and applied chemistry, A34(8), 1997, pp. 1493-1497
Two polyaniline toluenesulfonates with different crystallinities were
synthesized by using iron(III) and copper(II) toluenesulfonates, respe
ctively, as oxidative coupling agents. The toluenesulfonate obtained w
ith the iron(III) salt showed well-defined X-ray powder diffraction pe
aks; the other toluenesulfonate showed a diffuse pattern. When the tol
uenesulfonate with the higher crystallinity was neutralized and then d
oped again with HCl, the resulting polyaniline chloride showed an X-ra
y pattern closely resembling that of the original toluenesulfonate. Th
e diffraction patterns of the toluenesulfonate and the chloride can be
interpreted by assuming an essentially identical crystal packing in t
he unit cell. Since the cell volumes of the two salts are almost ident
ical, the counteranion with a larger molecular size has a closer conta
ct with a polyaniline chain; the close intermolecular contact may enha
nce interchain diffusion of charge carriers.