The challenges of macro integration for fully automated 300mm fabs

Citation
M. Chase et al., The challenges of macro integration for fully automated 300mm fabs, SOL ST TECH, 43(10), 2000, pp. 52
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
SOLID STATE TECHNOLOGY
ISSN journal
0038111X → ACNP
Volume
43
Issue
10
Year of publication
2000
Database
ISI
SICI code
0038-111X(200010)43:10<52:TCOMIF>2.0.ZU;2-1
Abstract
With 300mm wafer processing, the industry should finally realize the dream of hands-off wafer processing - a factory run by a finely tuned "silicon ma chine." The route to this concept will require some rigorous and fundamenta l changes by those responsible for fab automation, however. For example, th e industry must address the accuracy, access, and application of process to ol data; suppliers must step up to the ownership of fab-wide integration of production resources; and everyone must adopt the principles of industrial engineering.