An introduction to mu TA (TM) and its application to the study of interfaces

Microthermal analysis (mu TA(TM) combines the-high resolution visualization and positioning methods of scanning probe microscopy with the technology o f thermal analysis. Equivalent to atomic force microscopy (AFM), the surfac e under investigation is scanned first to image its topography. Simultaneou sly, contrasts in thermal conductivity and/or thermal diffusivity across th e surface of the sample are acquired. Based on these images specific locati ons are then selected for further thermal analysis (mu TMA and mu MDTA as l ocal counterparts to thermomechanical, TMA, and modulated differential ther mal analysis, MDTA). In this article, the principles of mu TA will be explained first; thereafte r, the application of mu TA to the studies of interfaces will be discussed. (C) 2000 Elsevier Science B.V. All rights reserved.