Precision farming application requires better understanding of variability
in yield patterns in order to determine the cause-effect relationships. Thi
s field study was conducted to investigate the relationship between soil at
tributes and corn (Zea mays L)-soybean (Glycine max L.) yield variability u
sing four years (1995-98) yield data from a 22-ha field located in central
Iowa. Corn was grown in this field during 1995, 1996, and 1998, and soybean
was grown in 1997. Yield data were collected on nine east-west transects,
consisting of 25-yield blocks per transect. To compare yield variability am
ong crops and years, yield data were normalized based on N-fertilizer treat
ments. The soil attributes of bulk density, cone index, organic matter aggr
egate uniformity coefficient, and plasticity index were determined from dat
a collected at 42 soil sampling sites in the field. Correlation and stepwis
e regression analyses over all soil types in the field revealed that Tilth
Index, based upon soil attributes, did not show a significant relationship
with the yield data for any year and may need modifications. The regression
analysis showed a significant relationship of soil attributes to yield dat
a for areas of the field with Harps and Ottosen soils. From a geographic in
formation system (GIS) analysis performed with ARC/INFO, it was concluded t
hat yield may be influenced partly by management practices and partly by to
pography for Okoboji and Ottosen soils. Map overlay analysis showed that ar
eas of lower yield for corn, at higher elevation, in the vicinity of Ottose
n and Okoboji soils were consistent from year to year; whereas, areas of hi
gher yield were variable. From GIS and statistical analyses, it was conclud
ed that interaction of soil type and topography influenced yield variabilit
y of this field. These results suggest that map overlay analysis of yield d
ata and soil attributes over longer duration can be a useful approach to de
lineate subareas within a field for site specific agricultural inputs by de
fining the appropriate yield classes.