Polymer films containing CxFy have been deposited in Fluorinert vapor (C7F1
6) plasmas. The spatial and temporal evolution of optical emission of CF2 a
nd C-2 radicals was monitored and kinetics of the C7F16 decomposition proce
ss was discussed. The films were deposited on stainless steel, glass, molyb
denum and silicon wafers at room temperature with the vapor pressures, 40 a
nd 100 Pa. Electrical properties such as the breakdown voltage and dielectr
ic constant as well as the structure of the films were analyzed. The compos
ition and characteristics of the films were determined by Fourier transform
infrared spectroscopy and X-ray photoelectron spectroscopy techniques, sca
nning electron microscopy and electron spin resonance spectroscopy. (C) 200
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