Continuous-wave Z-scan measurement of photorefractive SBN : 60

Citation
A. Siahmakoun et al., Continuous-wave Z-scan measurement of photorefractive SBN : 60, APPL OPTICS, 39(29), 2000, pp. 5360-5366
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
29
Year of publication
2000
Pages
5360 - 5366
Database
ISI
SICI code
0003-6935(20001010)39:29<5360:CZMOPS>2.0.ZU;2-D
Abstract
A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-det ector data-acquisition system was used to account for temporal changes in t he laser. The effects of various beam parameters such. as intensity, polari zation, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was als o developed. This model provides reasonable agreement with the experimental results. (C) 2000 Optical Society of America. OCIS codes: 160.5320, 160.43 30, 190.4400, 190.5330, 190.7070.