The critical behaviour of the spin-in Ising film in a random transverse fie
ld has been studied by the use of an effective field method within the fram
ework of a single cluster theory. The equations are derived using a probabi
lity distribution method. The effect of the ratio R of the surface exchange
interaction to the bulk one, random transverse fields at the surface and i
n the bulk and film thickness on the phase diagrams are investigated.