High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites

Citation
Km. Knowles et S. Turan, High resolution transmission electron microscopy of grain boundaries between hexagonal boron nitride grains in Si3N4-SiC particulate composites, CRYST RES T, 35(6-7), 2000, pp. 751-758
Citations number
14
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
35
Issue
6-7
Year of publication
2000
Pages
751 - 758
Database
ISI
SICI code
0232-1300(2000)35:6-7<751:HRTEMO>2.0.ZU;2-S
Abstract
High resolution transmission electron microscope observations of grain boun daries in hexagonal boron nitride in which adjacent grains are rotated with respect to one another about either <2 (1) over bar (1) over bar 0> or <10 (1) over bar 0> directions are shown to be free of intergranular glass, in agreement with previous work. The implication of these observations is tha t the solid-solid boundary energies of such grain boundaries in hexagonal b oron nitride are relatively small in magnitude.